“Optical-axis Parallelism Calibration System and Calibration Method” Is Granted Patent Authorization

Data:22-09-2016  |  【 A  A  A 】  |  【Print】 【Close

    With development of science and technology, photoelectric equipment has presented richer functions and higher performance indexes, and spectrum of optical equipment has almost covered all bands from visible light to infrared light, able to obtain not only physical characteristic parameters of targets but also the information on spectral characteristics of targets. For such kind of equipment integrated with multiple optical instruments, parallelism of optical axis is an important performance parameter and plays imperative role in guaranteeing system precision and accuracy.

    Tian Liude, Zhao Jianke and Zhou Yan with the Testing Center, XIOPM, addressing the subject, have researched an optical axis parallelism calibration system and calibration method, which has been granted national patent authorization recently.

    The method can work with simple testing equipment, namely common optical detection mirror and self-alignment theodolite, without needing clumsy, complicated and expensive equipment, featuring simple testing procedures, less process variable, high measurement precision, simple data processing and good real-time effect. It can not only be used for calibration of multi-optical-axis parallelism, but also for installation and adjustment of multi-sensor system, meaning wide field of application. In addition, the method is not only suitable for testing and calibration of the parallelism of optical axis of multi-optical-axis photoelectrical equipment, but also for testing of the parallelism of multiple parallel optical tubes and optical axes, a strong suitability. The method is free from limitation of the distance between sensors and caliber of sensors, and allows use of small-caliber self-alignment theodolite to realize testing of the parallelism of optical axis between multiple sensors with arbitrary distances and any calibers.