The 2nd meeting of Technical Committee 284 on Optical Radiation Safety and Laser Equipment of Standardization Administration of China (SAC/TC284) was held in Xining City, Qinghai Province from July 22 to July 27. On July 25, the two national standards General Specifications for Semiconductor Lasers and Test Methods of Semiconductor Lasers which were jointly prepared by 7 units including Xi’an Focuslight Technology Co., Ltd., XIOPM, Institute of Semiconductors of Chinese Academy of Sciences, etc. were verified on the meeting. Vice General Manager Zhang Yanchun from Focuslight Company introduced the preparation process, exposure draft condition and final manuscript review of the two standards. The two national standards passed with unanimous votes by all SAC/TC284 members, which means they have finished technical contents and are able to form standard draft for approval. They are to be organized for standard format review by SAC/TC284 and then reported to China Machinery Industry Federation, Standard Review Department and Standardization Administration of The People’s Republic of China, Standard Review Department.
The formulation of the two national standards General Specifications for Semiconductor Lasers and Test Methods of Semiconductor Lasers has great significance on overall improvement of semiconductor lasers market specification and industry level.
