2009 International Conference on Optical Instrument and Technology (OIT’09)

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The 2009 International Conference on Optical Instrument and Technology (OIT’09) is the second event following the OIT’08 and it is sponsored corporately by SPIE, CIS and COS. OIT’09 is a professional conference which takes instrument and related technology as its core. To promote the integration of science with technology in instrumentation fields, the conference is combined with the exhibition of “The 20th Fair for Measurement Instrumentation and Automation (MICONEX)”. It can be expected that OIT’09 will promote the continuous development of optoelectronic technology & instrument knowledge and stimulate new energy to the industry.

Scientific instrument is an indispensable branch and plays more and more important roles in developing national economy, also in the fields of scientific research. Optoelectronic instrument and technology is the essential component of scientific instrument. It has its outstanding functions in many technical spheres such as: detection; observation; information collection, transfer and storage; communication; economization on energy; environmental protection; inspection and prevention of food security, traffic safety and mine safety; measure and control for aviation and space engineering, etc.

China Instrument and Control Society (CIS) & The Chinese Optical Society (COS) are National Learned Societies awarded by the China Association for Science and Technology (CAST). CIS is the authorized scholarly organization in the fields of instrument and meters, measurement and control, automation and related technology and industry, and of optics and optical engineering, etc. COS has significant advantages in optics, optoelectronics, imaging, optoelectronic information technology, optical communication, lasers, optical display, basic optics and spectroscopy. Optical technology has become an edge of discipline and affects a variety of fields.

The “International Conference and Fair for Measurement Instrumentation and Automation (MICONEX)” originated by CIS has great impact on domestic and overseas industry. CIS has been making great efforts on MICONEX for more than 20 years, and MICONEX has received around 600 manufacturers and traders coming from 21 countries and regions over the world, the exhibition area has reached 25 thousands square meters. MICONEX is held once every year, the exhibition location is Beijing or Shanghai, China, separately in turn. It is believed that the combination of OIT conference and MICONEX will obtain more perfect effects.

OIT’09 will highlight the core of optoelectronic instrument and technology. The academic topics of conference will focus on the optical system, optoelectronic instruments, optical trapping, imaging, optoelectronic measurement and optoelectronic devices, etc. OIT’09 sponsors will provide an academic intercommunion platform to communicate the newest interested science or technology for all attendees, researchers and experts from all over the world. You are warmly welcomed to participation in this event at Shanghai, China and any of your contributions to OIT’09 are greatly appreciated.

All the papers (ORAL or POSTER) admitted by OIT’09 conference will be edited and published by SPIE, and the proceedings of OIT’09 will be indexed by EI, ISI, INSPEC, AIAA or other index systems. 

Date: 19-22 October 2009
Place: Shanghai Everbright International Hotel
Language: English

Critical Dates: Abstract Due: 15 June 2009
Manuscript Due : 10 Sept. 2009 
Sponsored by:
CIS (China Instrument and Control Society)

COS (The Chinese Optical Society)

SPIE (The International Society for Optical Engineering)

Cooperating Organizations:

Opto-Electronic –Mechanic Technology and System Integration Chapter, CIS

University of Shanghai for Science and Technology

Beijing Institute of Technology

Optical Instrument Chapter, CIS

Instrument Society of America

Institute of Measurement and Control

Hong Kong Institution of Engineers

The Society of Instrument and Control Engineers

Capital Normal Univ

Hamamatsu Photonics K.K. (JAPAN) 

Chongqing Univ

Tsinghua Univ

Tianjin Univ

Zhejiang Univ

Nanjing Univ 

General Chair:

Songlin Zhuang, Shanghai Univ. of Science and Technology (China)

General co-Chairs:  

Yuri Chugu, New Siberia Academy of Sciences, (Russia)

Arthur Chiou, SPIE/ National Yang-Ming University (Taipei, China)

Honorary Chairs:

Daheng Wang Chinese Academy of Sciences (CAS)

T.Hiruma Hamamatsu Photonics K.K.(JAPAN)

Guoguang Mu Nankai Univ. (China)

Bingkun Zhou Tsinghua Univ. (China)

Technical Program Chair:

Guofan Jin Tsinghua Univ. (China)

Technical Program Co-Chairs:

Yimo Zhang Tianjin Univ.

Sien Chi National Chiao Tung University (Taipei, China)

Local Organizing Committee Chair:

Youhua Wu China Instrument and Control Society

Local Organizing Committee Co-Chairs:

Guoqiang Ni Beijing Institute of Technology

Daoyin Yu Tianjin Univ.

Yulin Xi Beijing Hamamatsu Photon Techniques INC.

Zhengji Ni University of Shanghai for Science and Technology (China)

Jinxue Wang SPIE (USA)

General Secretary:

Youhua Wu China Instrument and Control Society

Administrative Vice General Secretary/:

Boyu Ding Beijing Institute of Technology

Vice General Secretaries:

Hanquan Zhang China Instrument and Control Society

Xiongwen Qin China Instrument and Control Society

Yuejin Zhao Beijing Institute of Technology

Tiegen Liu Tianjin Univ.

Qionghui Feng Shanghai Univ. of Science and Technology

Cunlin Zhang Capital Normal Univ.

Local Organizing Committee:

Weimin Chen Chongqing Univ.

Hongda Chen Institute of Semiconductors, CAS

Yan Zhang Capital Normal Univ.

Shangzhong Jin Chinese Jiliang Univ.

Boshun Hu Modern Scientific Instruments

Libo Yuan Harbin Engineering University

Tian Lan Beijing institute of Technology





Secretariat Contact

Cuilingli  Phone & Fax: 010-68912564 Cuilingli@bit.edu.cn

Liquan Dong  Phone & Fax: 010-68912559-2 kylind@bit.edu.cn

Boyu Ding  Phone & Fax: 010-82616603 Dingboyu@vip.sohu.com

Session 1

Optical Systems and Modern Optoelectronic Instruments 

Conference Chairs:

Yunlong Sheng, Laval University (Canada)

Kimio Tatsuno, Hitachi (Japan)

Yongtian Wang, Beijing Institute of Technology (China)

Program Committee:

Jiabi Chen, University of Shanghai for Science and Technology (China)

Chunlei Du, Institute of Optics and Electronics (China)

Jia-Ruey Duann, Industrial Technology Research Institute (Taiwan, China)

Sen Han, Veeco Instruments (USA)

Qun Hao, Beijing Institute of Technology (China)

Mei-Li Hsien, National Taiwan Normal University (Taiwan, China)

Hong Hua, University of Arizona (USA)

Ken Y. Hsu, National Chiao Tung University (Taiwan, China)

Hisao Kikuta, Osaka Prefecture University (Japan)

Tsuyoshi Konishi, Osaka University (Japan)

Guoqing Li, University of Missouri (USA)

Irina Livsits, St. Petersburg State University (Russia)

Xiang Peng, Shenzhen University (China)

Jannick Rolland, University of Rochester (USA)

Han-Ping Shieh, National Chiao Tung University (Hsinchu, China)

Yeong-Shin Tarng, National Taiwan University of Science and Technology (Taiwan, China)

Din Ping Tsai, National Taiwan University (Taiwan, China)

Willi Ulrich, Carl Zeiss (Germany)

Paul Urbach, Delft University of Technology (Netherland)

Yuejin Zhao, Beijing Institute of Technology (China)

Secretary: Nan Zhu, Beijing Institute of Technology


        Design and Application of Virtual Instruments

        Design and Optimization Methods for Optical Systems and Optoelectronic Instruments

        Diffractive Optical Systems

        Image Processing and its Application in Instruments

        Infrared Optical Systems and Instruments

        Instruments for Laboratories and Science Research

        Micro Optical Systems

        Novel Optical Elements and Applications

        Optical Displays: Systems, Devices and Materials

        Spectral Instruments

        Stray Light Analysis

        Subsystems and Components Design and Manufacture

        UV Optics and X-ray Optics

        Zoom Optical System


Session 2

Optical Trapping and Microscopic Imaging

Conference Chairs:

Xiaocong Yuan, Nankai University (China)

Yinmei Li, University of Science and Technology of China (China)

Arthur Chiou, National Yang-Ming University (Taipei, China)

Min Gu, Swinburne University of Technology (Australia)

Dennis Matthews, UC Davis (USA)

Colin Shepherd, National University of Singapore (Singapore)

Program Committee:

Zhongping Chen, University of California, Irvine (USA)

Daniel Elson, Imperial College London (UK)

Paul French, Imperial College London (UK)

Bruce Z. Gao, Clemson University (USA)

Aaron H.P. Ho, The Chinese University of Hong Kong (China)

Hui Ma, Tsinghua University (China)

H. Daniel Ou-Yang, Lehigh University (USA)

Xuanhui Lu, Zhejiang University (China)

Halina Rubinsztein-Dunlop, The University of Queensland (Australia)

Monika Ritsch-Marte, Innsburck Medical University (Australia)

Da Xing, South China Normal University (China)

Chinlon Lin, Nanyang Technological University (Singapore)

Xiaohui Zhang, Chinese Academy of Sciences (China)

Jesper Glückstad, Danmarks Tekniske University (Denmark)

Siwei Zhu, Tianjin Union Medicine Centre (China)

Secretary: Xing Zhao (Nankai University)

Optical trapping and micro- & nano-scale imaging are current “hot” topics in the field of optical science and engineering. Optical trapping offers unique non-invasive forces on micro- and nano-sized particles and biological samples for the purpose of micromanipulation, which enables diverse applications in the studies of biological cells, molecules, DNA, novel chemical synthesis and soft condense matter and hydrodynamic interactions. Novel imaging, sensing and spectroscopy techniques, on the other hand, are complementary optical methods for studying and understanding the biological samples in terms of observation and measurement. The optical trapping and imaging techniques provide significant opportunities in biomedical applications with novel ideas and enhancement. Major topics include, but are not limited to:


        Optical trapping and manipulation

        Optical sorting



        Fundamental Concepts

        Novel Imaging

        Novel Sensing

        Novel spectroscopy

        Applications of optical trapping

        Optical trapping assisted systems


Session 3

Advanced Sensor Technology and Applications 

Conference Chairs:

YanBiao Liao, Tsinghua University (China)

Anbo Wang, Virginia Polytechnic Institute and State Univ. (USA)

Tingyun Wang, Shanghai University, (China)

Yukihiro Ishii, Tokyo University of Science(Japan)

Program Committee:

Weihong Bi, Yanshan University, (China)

Rongshen Chen, The University of Birmingham (UK)

Weimin Chen, Chongqing University (China)

Zhe Chen, Jinan University (China)

Kin Seng Chiang, City University of Hong Kong (Hong Kong China)

Fajie Duan, Tianjin University (China)

Claire Gu, University of California at Santa Cruz(USA)

Shibin Jiang, NP Photonics, Inc, (USA)

Wei Jin, Hong Kong Polytechnic University (Hong Kong China)

Gan-Ding Peng, University of New South Wales (Australia)

Yunjian Rao, University of Electronic Science and Technology of China (China)

Aiguo Song, Southeast University (China)

Hai Xiao, University of Missouri, (USA)

Libo Yuan, Harbin Engineering University (China)



        Physical and Mechanical Sensors

        Chemical, Environmental and biomedical Sensors

        Sensors for Electrical, Magnetic field Measurement

        Mutiplexing and Integration of Sensors

        Interferometric and Polarimetric Sensors

        Micro Structured Optical Fiber Sensors

        Optical Planar Waveguide-based Sensors

        Passive and Active Components for Photonic Sensing

        Distributed and Quasi-distributed Sensing

        Visual Sense Sensor

        Sensor Network

        Applications for Sensor

        Optical Fiber Sensors


Session 4
Optoelectronic Devices & Integration

Conference Chairs:

Xuping Zhang, Nanjing University (China);

Wojtek J. Bock, Université du Québec en Outaouais, Qué (Canada)

Xuejun Lu, Univ. of Massachusetts/Lowell (USA)

Hai Ming, University of Science and Technology of China (China)

Program Committee:

Xiaoyi Bao, University of Ottawa( Canada)

Sien Chi, National Chiao Tung University (Taiwan, China)

Haiyong Gan, OmniVision Technologies Inc., ( USA)

Yi Li, University of Shanghai for Science and Technology (China)

Edwin Y B PunCity University of Hong KongHong Kong

Ping Shum, Nanyang Technological University (Singapore)

Feng Song, Nankai University(China)

Suning Tang, Crystal Research, Inc. (USA)

Scott S. H. Yam, Queen’s University, Kingston, (Canada)

Jianyi Yang, Zhejiang University (China)

Secretary: Zhaolong Li, Nanjing University (China)


        Physics and Simulation of Optoelectronic and Photonic Crystal Fiber Devices

        Photonic Crystal Fiber and Photonic Crystal Fiber Based Devices

        Fiber Amplifiers and Lasers

        Polarization Maintained / Scrambled Lasers

        Semiconductor Photoelectronics

        Micro-Optics and Photoic Inter-connectors

        Multifunctional Components and Arrayed Devices

        Terahertz and Gigahertz Electronics and Photonics

        High-power fiber laser

        Emerging Optoelectronic Applications

        Optoelectronic Hybrid and Monolithic Integration

        Integrated Optics and Photonic Integrated Circuits

        Advanced Micro Optoelectronic Devices

        Photonics Materials and Devices

        Surface Plasmon Nanolithography, Plasmonic Waveguided and Devices

        Fibre Grating and Its Applications

        Integrated optics

        Optical switcher, connector, modulator and other active and passive devices

        Waveguide devices


Session 5

MEMS/NEMS Technology and Applications 

Conference Chairs:

Zhaoying Zhou, Tsinghua Univ. (China)

Helmut Seidel, Microfluidics/Microactuators, Saarland University (Germany)

XinXin Li, Shanghai Institute of microsystem and information technology, CAS (China)

Toshio Fukuda, Nagoya University (Japan)

Wen J. Li, The Chinese University of Hong Kong (China)

Xiaoning Jiang, TRS Technologies, USA (USA)

Program Committee:

Shuo-Hung Chang, National Taiwan University (Taiwani, China)

Longsheng Fan, Cellular and Molecular BioMEMS Laboratory, NTHU (China)

Hong Hocheng, National Tsinghua University (Taiwani, China)

Roger T. Howe, Department of Electrical Engineering, Stanford University (USA)

Wen J. Li, The Chinese University of Hong Kong (China)

Liwei Lin, University of California at Berkeley (USA)

Aiqun Liu, Nanyang Technological University (Singapore)

Sixing Liu, Bandag Incorporated (USA)

Zhichun Ma, Ford Motor Company (USA)

Isao Shimoyama, School of Information Science and Technology, University of Tokyo (Japan)

Man WONG, The Hong Kong University of Science & Technology (China)

Wengang WuPeking University (China)

Xing Yang, Tsinghua University (China)

Yang ZhaoPresident & CEO. MEMSIC Inc.(China)



        Innovative Concept, Mechanism & Phenomenon in MEMS/NEMS

        Micro Sensors & Micro Actuators

        Inertial-MEMS and Applications

        Optical-MEMS, Micro-optics, Micro Optical-electro Elements and Applications

        Bio-MEMS, Chemical MEMS and Applications

        RF MEMS, Remote Sensing Technology and Instruments

        Micro-fluidics, Devices, Instruments

        MEMS/NEMS Fabrication and Foundry

        Nano-device, NEMS and Nanotechnology

        Applications for MEMS/NEMS Technology & System Integration

        Others (Including MEMS /NEMS Design, Test, Packaging, Reliability, etc.)


Session 6

Optoelectronic Measurement Technology and System

Conference Chairs:

Shenghua Ye, Tianjin Univ. (China)

Guangjun Zhang, Beijing Univ. of Aeronautics & Astronautics (China)

Jun Ni University of Michigan (USA)

Program Committee:

Kexin Xu, Tianjin Univ. (China)

Changku Sun, Tianjin Univ. (China)

Dingguo Sha, Beijin Institute of Technology, (China)

Shangzhong Jin, China Jiliang Univ. (China)

Bukem Bilen, Bogazici UniversityTurkey

Osami Sasaki , Niigata Univ (Japan)

Takamasa Suzuki, Niigata Univ (Japan)

Jiubin Tan, Harbin Institute of Technology, (China)

Qibo Feng, Beijing Jiaotong Univ. (China)

Jigui Zhu, Tianjin Univ. (China)



        Optoelectronic Measurement in Metrology

        Optoelectronic Measurement in Manufacturing Industry

        Optoelectronic Measurement in Process of Production

        Optoelectronic Measurement in Agriculture, Chemical and Environment

        Optoelectronic Measurement in Biology and Medicine

        Optoelectronic Measurement in Aerospace

        Optoelectronic Measurement in Control and Virtual Reality

        Optoelectronic Measurement in safety and Diagnosis

        Optoelectronic Measurement in Mechanical Capacity and Electronical Capacity

        Optoelectronic Measurement in Energy and Transportation

        Optoelectronic Measurement in Architecture and Engineering Structure


Session 7

Opto-electronic information security 

Conference Chairs:

Cunlin Zhang, Capital Normal University (China)

Tiegen Liu, Tianjin University (China)

Daniel Grischkowsky, Oklahoma State University (USA)

Program Committee:

Pierre Chavel, National Committee for Scientific Research (France)

Hou-Tong Chen, Los Alamos National Lab, USAUSA

Xiang Peng, Shenzhen University (China)

Daxiong Xu, Beijing University of Posts and Telecommunications (China)

Chongxiu Yu, Beijing University of Posts and Telecommunications (China)

Hongchen Zhai, Tianjin University (China)

Dawei Zhang, University of Shanghai for Science and Technology (China)

Jingjuan Zhang, Graduate University of Chinese Academy of Sciences (China)


In the field of information security, opto-electronic technology and instrumentation is a promising approach. It includes not only traditional research topics, such as laser holography an-ticounterfaking, opto-electornic secure identification and verification, opto-electronic informati-on security devices and systems, but emerging ones such as THz radiation offers the opportunity for transformational advances in defense and security, opto-electronic information embedding and coding, opto-electronic devices in biometric recognition. This symposium is believed to contribute to the development of opto-electronic technology in information security, the security of financial circulation and furthermore to the tackling of global financial crisis.


        THz technology in security and defense

        Laser holography anticounterfaking

        Opto-electronic information embedding and coding

        Opto-electornic secure identification and verification

        Opto-electronic technology and instrumentation in biometric recognition

        Opto-electronic information security devices and systems


Session 8

Opto-electronic Imaging and Processing Technology

Conference Chairs

Toru YoshizawaSaitama Medical UniversityJapan

Ping WeiBeijing Institute of TechnologyChina

Jesse ZhengPhotontech Instruments Corp.Canada

Program Committee

Tingzhu BaiBeijing Institute of TechnologyChina

Ruowei GuOpton Co.,Ltd.Japan

Tangjun LiBeijing Jiao tong UniversityChina

Peilin LiuShanghai Jiao tong UniversityChina

Yinglong LiuCentral South UniversityChina

Cunwei LuFukuoka Institute of TechnologyJapan

Tsutomu ShimuraThe University of TokyoJapan

Xiaodi TanSony Corp.Japan

Pingtao WangO&E Co.,Ltd.Japan

Shengli WuXi’an Jiao tong UniversityChina

Jingyun ZhangAreo-creative Corp.USA

SecretaryLingxue WangBeijing Institute of TechnologyChina


Topics of interest include all aspects of Opto-electronic Imaging and Processing Technology, but are not limited to, the following areas:

        Image sensors and applications

        Intelligent/smart cameras and applications

        High-resolution and high-speed cameras and applications

        Image processing algorithms and systems

        Machine vision methods, architectures and applications

        Three-dimensional profilometry by structured light, interferometry and Advancement in Shape-from-X methods

Multi-spectral Imaging

Performance Evaluation

Object Detection and Recognition

Optical Corelation

Optical Information Storage

Digital Hologram/Image

Imaging techniques for manufacturing

Imaging techniques for security

Imaging techniques for ITS

Imaging techniques for Aerial Survey

Imaging techniques for Environment

Imaging for nursing care and welfare

Imaging for medical and biomedical applications

Diagnostic imaging by ultra-sonics, PET, MRI, X-ray CT